SX1211
WIRELESS & SENSING
7.6. Reference Design Performance
All the measurements visible on section 7.6 typical figures obtained under the following conditions, unless
otherwise noted:
Nominal VDD = 3.3 V
Tests performed at room temperature: 25°C +/-3°C
Center frequency 869 MHz or 915 MHz
{R, P, S} triplets are those calculated by the software described in section 3.2.8.
All register settings are default, except for those stated in the relevant sub-sections
Maximum Output Power programmed on Pout tests
All sensitivities are evaluated in Continuous mode, demodulating a PN15 sequence, BER=0.1%
FSK sensitivities measured at 25kbps, Fdev=+/-50 kHz
OOK sensitivities measured at 8kbps, with Fo=100 kHz. IF2 set to 100 kHz.
On all Adjacent Channel Rejection (ACR), Blocking and Spurious Response Frequency tests, the unwanted
signal is unmodulated.
Bill of Materials as shown in section 7.5.3. In particular, a SAW filter is used (see its performance on section
7.5.4)
The filter settings described on Table 37 and Table 38 were used for the measurements of section 7.6.5.
Table 37: FSK Rx Filters vs. Bit Rate
Bit Rate
Fdev
Filter
Fdev
Rx 3 dB BW
Max. drift
Setting
+
Addr 16
BR/2
Programmed
Actual
kbps
100
66.67
50
40
33.33
28.57
25
22.22
20
18.18
16.67
15.38
14.29
12.5
10
5
2
+/- kHz
200
133
100
80
67
57
50
44
40
36
33
33
33
33
33
33
33
Hex
FF
E9
D6
B5
A4
A3
A3
72
72
72
72
41
41
41
41
41
41
kHz
250
166.7
125
100
83.3
71.4
62.5
55.6
50
45.5
41.7
41
40.5
39.6
38.3
35.8
34.3
kHz
400
250
175
150
125
100
100
75
75
75
75
50
50
50
50
50
50
kHz
306
214
158
137
116
96
96
69
69
69
69
47
47
47
47
47
47
+/- ppm
62
53
37
41
36
27
37
15
21
26
30
7
7
8
10
12
14
Table 38: OOK Rx Filters vs. Bit Rate
Bit Rate
F O + BR
Filter
Rx 3 dB BW
Max.
Setting
drift
Addr 16
Programmed
Actual
kbps
16.67
12.5
9.52
8
4.76
2.41
1.56
kHz
117
113
110
108
105
102
102
Hex
C1
C1
A0
A0
A0
A0
A0
kHz
150
150
125
125
125
125
125
kHz
154
154
129
129
129
129
129
+/- ppm
41
46
22
23
27
30
30
Rev 8 – February 2013
Page 76 of 92
www.semtech.com
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